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CLAD PDF obtain - Certified LabVIEW Associate Developer (CLAD) |

NI CLAD : Certified LabVIEW Associate Developer (CLAD) test Dumps

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Exam Number : CLAD
Exam Name : Certified LabVIEW Associate Developer (CLAD)
Vendor Name : NI
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CLAD test Format | CLAD Course Contents | CLAD Course Outline | CLAD test Syllabus | CLAD test Objectives

The best preparation for this test is LabVIEW programming experience applying the concepts presented in LabVIEW Core1 and Core2 courses. Class attendance alone will not be sufficient. Typical CLAD candidates have taken NIs LabVIEW Core 1 and Core 2 courses (or equivalent) and have at least 6 to 9 months of experience using LabVIEW.

This prep guide provides an overview of the exam, including test logistics and coverage. The relevant knowledge, skills and abilities (KSAs) tested by the CLAD test are listed in the KSAs: Knowledge, Skills and Abilities tested by the CLAD section. A detailed Topic List table follows the KSA descriptions.

This prep guide also includes example questions. This is not a demo exam. The questions are included as a study aid. They reflect the scope of the CLAD test and familiarize the test-taker with NIs approach to testing the KSAs relevant to a Certified LabVIEW Associate Developer.


A score of 70% or higher is required to pass the exam.

Individuals may take the CLAD test at any PearsonVUE testing center by scheduling the test at When you schedule the exam, be sure to specify whether you wish to take the test using LabVIEW NXG or LabVIEW 20xx (where xx indicates current year). The images and terminology of the test will reflect the LabVIEW editor you choose, but the test content will otherwise be identical. Simply choose the LabVIEW editor with which you are most comfortable.

Passing the CLAD test using either editor earns the same CLAD Certification.

You cannot use LabVIEW or any other resources during the exam. The CLAD test provides screenshots from the LabVIEW environment and LabVIEW Help where appropriate. Refer to the Example Questions & Resources section for examples.

To take the exam, you must agree to a Non-Disclosure Agreement (NDA). The NDA states that you will not copy, reproduce, or communicate any section of the test in any form, including verbal or electronic. Failure to comply with the NDA will result in penalties ranging from a failed test to a lifetime ban from LabVIEW Certification

The CLAD test centers around jobs requiring programming in professional settings, including Automated Test, High-Channel-Count Data Acquisition, or Domain Support. Most of these jobs include collecting and/or processing data in the form of signals from sensors. To verify the relevant knowledge, skills and abilities, the CLAD uses an NI-DAQmx system as representative hardware. NI-DAQmx was chosen because it can be simulated on all versions of LabVIEW. If you have access to LabVIEW, you have the resources to prepare for the exam. You do not need to purchase specific hardware.

Appendix I of the document provides instructions for setting up simulated hardware sufficient for test preparation. The appendix also includes a list of the DAQmx functions possibly used in the exam. The test does not test DAQmx function-specific settings. The questions use NI-DAQmx to test knowledge and skills necessary for common data acquisition tasks, such as calculating demo rates, determining the correct order of operations, and programming basic file I/O.

A person using LabVIEW at the Associated Developer level will be able to:

• Use software architectures from a single VI to a simple State Machine or Event-Driven UI


• Collect data from sensors using NI Hardware.

• Use Array functions extensively to extract and manipulate a single channel of data from multiple-channel data represented by a 1D waveform array or a 2D numeric array.

• Use loops to run a test a set number of times or until a condition is met, to establish a voltage ramp, or conduct other repeated tasks.

• Create and modify SubVIs, clusters, and Type Defs to simplify their code and contribute to larger projects.

Hardware (10% of test questions)

• Connecting Hardware: Sensors, DAQ, Devices under test (DUT.

• Acquiring and validating a signal

• Processing signals

• Using appropriate demo rates

LabVIEW Programming Environment (25% of test questions)

• Setting up and using a LabVIEW Project to:

o Add, delete, and move elements

o Use libraries and appropriate types of folders

o Avoid cross-linking

• Data Types:

o Recognize data types on the front panel

o Recognize data types on the block diagram from terminals and wires

o Choose appropriate controls, indicators, data types, & functions for a given scenario

• Predicting order-of-execution and behavior of

o A non-looping VI

o A Simple State Machine

o An Event-driven UI Handler

o Parallel Loops (without queues)

• Using basic functions to create a simple Acquire-Analyze-Visualize application

• Troubleshooting by identifying and correcting the cause of a broken arrow or incorrect data

• Error handling using error clusters and merge error functions to ensure errors are handled well

• Navigating LabVIEW help to get more information about inputs, outputs, and functions

LabVIEW Programming Fundamentals (50% of test questions)

• Loops

o Create continuous HW acquisition or generation loop by applying a

Open-Configure-Perform Operation-Close model.

o Retain data in shift registers

o Use input and output terminals effectively, including:

▪ Determining the last value output

▪ Indexing input and output terminals

▪ Concatenating output

▪ Using conditional output

▪ Using shift registers, both initialized and uninitialized.

o Use timing of loops appropriately, including:

▪ Software timing

▪ Hardware timing

o Use For Loops and While Loops appropriately


o View data from an n-channel HW acquisition VI (using the DAQmx Read VI) using a

waveform graph, waveform chart, or numeric/waveform array indicator.

o Extract a single channel of data (waveform or 1D Array) from a:

▪ 1D waveform array representing acquired data from multiple channels

▪ 2D numeric array representing acquired data from multiple channels

▪ 1D numeric array representing single measurement from multiple channels

o Use a For Loop with auto-indexing and conditional tunnels to:

▪ Iterate through an array

▪ Iterate processing code on each channel of data in a 1D waveform array

▪ Generate an array of data that meets required conditions

o Identify by sight and be able to use and predict the behavior of the following array

functions and VIs:

▪ Array Size

▪ Index Array

▪ Replace Subset

▪ Insert Into Array

▪ Delete From Array

▪ Initialize Array

▪ Build Array

▪ Array Subset

▪ Max & Min

▪ Sort 1D Array

▪ Search 1D Array

▪ Split 1D Array

• Writing conditional code to perform an action based on the value of a user input or a measurement result.

• reading and Writing data to a file

o Use Open/Act/Close model for file I/O

o Write data to a text file using high-level file I/O functions

o Continuously stream data to a text file or a TDMS file

o Append data to an existing data file

o Log data using simple VIs

Acquire data from DAQmx functions

o Display data on a graph

o Save data to a CSV file

o Choose single measurement/multiple channel and single channel/multiple

measurements configurations appropriately

Programming Best Practices (15% of test questions)

• SubVIs – Reusing Code

o Create SubVIs to increase readability and scalability of VIs

o Configure the subVI connector pane using best practices

o Choose appropriate code as a SubVI source

• Clusters – Grouping Data of Mixed Data Types

o Create, manipulate, analyze, and use cluster data in common scenarios

o Group related data by creating a cluster to Strengthen data organization and VI readability

• Type Defs – Propagate Data Type Changes

o Create Type Defs and use Type Defs in multiple places

o Update Type Defs to propagate changes to all instances of the Type Def

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South Korea cuts ‘killer questions’ from university entrance test in bid to reduce reliance on ‘cram schools’

South Korea will drop so-called “killer questions” from its notoriously tough college entrance test in a bid to reduce reliance on private cram schools, the education ministry said Tuesday.

More than half a million students sit the annual nine-hour test, known as “suneung”, which plays a crucial role in deciding a student’s college, career and even marriage prospects.

The inclusion of “killer questions”, which cannot be answered by simply studying the curriculum taught at state schools, was meant to help distinguish top students.

Self-made millionaire, age 56, sits China’s university exams for 27th time

But it has created an arms race of extra educational spending as parents and students flock to expensive private tutoring centres known as “hagwons” to get ahead.

“I will do everything I can in my capacity as the education minister... to exclude questions outside the public education system to make the test a fair test,” education minister Lee Ju-ho said on Monday.

On Tuesday the education ministry told Agence France-Presse it would press ahead with the reform, saying it “stood by” Lee’s comment.

South Korea’s ultra-competitive environment means many children attend “cram schools” to get ahead. Photo: Shutterstock

Previous efforts to change the system have flopped, including an attempt this year to remove “killer questions” from the mock exam.

The importance of the test is reflected in extraordinary measures that authorities take to prevent any disturbance, including suspending take-offs and landings at airports during the English listening test.

Enormous pressure placed on students in South Korea’s ultra-competitive education system has been blamed for teenage depression and suicide rates that are among the highest in the world.

Controversial experiment in Indonesia sees school starting at dawn

Lee said officials should “reflect on themselves” for previously failing to address the test’s difficulty, which he called the “driving force” behind explosive growth in private education.

While the government stood idly by, the pockets of cram schools “got fatter”, he added.

South Korean households spent more than US$20 billion on private education for primary, middle and high-school students last year, according to Statistics Korea.

The figure translates to a monthly average spend of US$320 per student.


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